Large-Area Film Thickness Identification of Transparent Glass by Hyperspectral Imaging

Abstract

This study introduces a novel method for detecting and measuring transparent glass sheets using hyperspectral imaging (HSI). The main goal of this study is to create a conversion technique that can accurately display spectral information from collected images, particularly in the visible light spectrum (VIS) and near-infrared (NIR) areas. This technique enables the capture of relevant spectral data when used with images provided by industrial cameras. The next step in this investigation is using principal component analysis to examine the obtained hyperspectral images derived from different treated glass samples. This analytical procedure standardizes the magnitude of light wavelengths that are inherent in the HSI images. The simulated spectral profiles are obtained using the generalized inverse matrix technique on the normalized HSI images. These profiles are then matched with spectroscopic data obtained from microscopic imaging, resulting in the observation of distinct dispersion patterns. The novel use of images coloring methods effectively displays the thickness of the glass processing sheet in a visually noticeable way. Based on empirical research, changes in the thickness of the glass coating in the NIR-HSI range cause significant changes in the transmission of infrared light at different wavelengths within the NIR spectrum. This phenomenon serves as the foundation for the study of film thickness. The root mean square error inside the NIR area is impressively low, calculated to be just 0.02. This highlights the high level of accuracy achieved by the technique stated above. Potential areas of investigation that arise from this study are incorporating the proposed approach into the design of a real-time, wide-scale automated optical inspection system.

Keywords

• hyperspectral imaging
• near-infrared
• transparent glass
• thickness estimation