Acta Periodica Technologica (Jan 2003)

Phosphogypsum surface characterisation using scanning electron microscopy

  • Rajković Miloš B.,
  • Tošković Dragan V.

DOI
https://doi.org/10.2298/APT0334061R
Journal volume & issue
Vol. 2003, no. 34
pp. 61 – 70

Abstract

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This paper presents the results of application of Scanning Electron Microscopy (SEM) to examinations of the samples of natural gypsum and phosphogypsum. Phosphogypsum has a well developed crystalline structure, and appear in two polymorphous forms, of rombic and hexagonal shape crystals. Natural gypsum has a poorly crystalline structure. The differences in crystalline structure influence the chemical behavior of these row materials.

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