X-Ray Diffraction under Extreme Conditions at the Advanced Light Source

Abstract

The more than a century-old technique of X-ray diffraction in either angle or energy dispersive mode has been used to probe materials’ microstructure in a number of ways, including phase identification, stress measurements, structure solutions, and the determination of physical properties such as compressibility and phase transition boundaries. The study of high-pressure and high-temperature materials has strongly benefitted from this technique when combined with the high brilliance source provided by third generation synchrotron facilities, such as the Advanced Light Source (ALS) (Berkeley, CA, USA). Here we present a brief review of recent work at this facility in the field of X-ray diffraction under extreme conditions, including an overview of diamond anvil cells, X-ray diffraction, and a summary of three beamline capabilities conducting X-ray diffraction high-pressure research in the diamond anvil cell.

Keywords

• crystallography
• diffraction
• high pressure
• diamond anvil cell
• beamline