Impedance spectroscopic and dielectric properties of nanosized Y2/3Cu3Ti4O12 ceramic

Abstract

Yttrium Copper Titanate (Y2/3Cu3Ti4O12) nanoceramic is structurally analogous to CaCu3Ti4O12 (CCTO). X-ray diffraction (XRD) of Y2/3Cu3Ti4O12 (YCTO) shows the presence of all normal peaks of CCTO. SEM micrograph exhibits the presence of bimodal grains of size ranging from 1–2 μm. Bright field TEM image clearly displays nanocrystalline particle which is supported by presence of a few clear rings in the corresponding selected area electron diffraction (SAED) pattern. It exhibits a high value of dielectric constant (ε′ = 8434) at room temperature and 100 Hz frequency with characteristic relaxation peaks. Impedance and modulus studies revealed the presence of temperature-dependent Maxwell–Wagner type of relaxation in the ceramic.

Keywords

• Ceramic
• chemical synthesis
• dielectric
• grain boundary
• impedance spectroscopy