Fast THz-TDS Reflection Imaging with ECOPS—Point-by-Point versus Line-by-Line Scanning

Abstract

We built a high-speed TDS setup with the use of electronically controlled optical sampling (ECOPS), which can measure up to 1600 terahertz pulses per second. The movement of the sample was provided by two fast-speed motorized linear stages constituting the gantry. We developed a flat-bar-based metal marker approach for the synchronization of continuous line-by-line scans. We carefully compared the performance of the terahertz reflection time-domain spectroscopy (TDS) scanner operating in a slow point-by-point and a one-hundred-times faster line-by-line imaging scheme. We analyzed images obtained for both schemes for a uniform metallic breadboard with holes, as well as a glass composite sample with defects. Although the measurement time was reduced by 100 times in terms of the line-by-line scheme, the overall performance in both schemes was almost identical in terms of the defects’ sizes, shapes and locations. The results proved that the proposed ECOPS TDS system can provide uniform and extremely fast scanning without any deterioration in image quality.

Keywords

• terahertz imaging
• time-domain spectroscopy
• nondestructive testing