A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect

Ting Xie; Michael Dreyer; David Bowen; Dan Hinkel; R. E. Butera; Charles Krafft; Isaak Mayergoyz

doi:10.1063/1.4991916

AIP Advances (Dec 2017)

A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect

Ting Xie,
Michael Dreyer,
David Bowen,
Dan Hinkel,
R. E. Butera,
Charles Krafft,
Isaak Mayergoyz

Affiliations

Ting Xie: Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742, USA
Michael Dreyer: Department of Physics, University of Maryland, College Park, Maryland 20742, USA
David Bowen: Laboratory for Physical Sciences, College Park, Maryland 20740, USA
Dan Hinkel: Laboratory for Physical Sciences, College Park, Maryland 20740, USA
R. E. Butera: Laboratory for Physical Sciences, College Park, Maryland 20740, USA
Charles Krafft: Laboratory for Physical Sciences, College Park, Maryland 20740, USA
Isaak Mayergoyz: Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742, USA

DOI: https://doi.org/10.1063/1.4991916
Journal volume & issue: Vol. 7, no. 12
pp. 125205 – 125205-6

Abstract

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A scanning tunneling microscopy based potentiometry technique for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry technique is developed and employed to maintain a desired tunneling voltage independent of the bias current flow through the film. The application of this potentiometry technique to the local sensing of the spin Hall effect is outlined and some experimental results are reported.

Published in AIP Advances

ISSN: 2158-3226 (Online)
Publisher: AIP Publishing LLC
Country of publisher: United States
LCC subjects: Science: Physics
Website: http://aipadvances.aip.org/

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