Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging

Zhixiang Sun; Mu Gu; Xiaolin Liu; Bo Liu; Juannan Zhang; Shiming Huang; Chen Ni

doi:10.1038/s41598-022-12673-9

Scientific Reports (May 2022)

Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging

Zhixiang Sun,
Mu Gu,
Xiaolin Liu,
Bo Liu,
Juannan Zhang,
Shiming Huang,
Chen Ni

Affiliations

Zhixiang Sun: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University
Mu Gu: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University
Xiaolin Liu: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University
Bo Liu: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University
Juannan Zhang: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University
Shiming Huang: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University
Chen Ni: Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University

DOI: https://doi.org/10.1038/s41598-022-12673-9
Journal volume & issue: Vol. 12, no. 1
pp. 1 – 9

Abstract

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Abstract To improve the detection efficiency of the structured scintillation screen with CsI(Tl) micro-square-frustums based on oxidized Si micropore array template in the case of a period as small as microns, the influence of Si wall thickness of the CsI(Tl) micro-square-frustums on the performance of the structured screen in X-ray imaging was investigated. The results show that when CsI(Tl) at the bottom of the screen is structured, the detective quantum efficiency (DQE) improves at almost all spatial frequency as the top thickness of the Si wall tSi decreases. However, when CsI (Tl) at the bottom of the screen is not structured, the DQE becomes better at low-frequency and worse at high-frequency as tSi decreases. The results can provide guidance for optimizing tSi according to the comprehensive requirements of detection efficiency and spatial resolution in X-ray imaging.

Published in Scientific Reports

ISSN: 2045-2322 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Medicine; Science
Website: https://www.nature.com/srep/

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