Journal of Synchrotron Radiation (Nov 2022)

Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry

  • Young Yong Kim,
  • Ruslan Khubbutdinov,
  • Jerome Carnis,
  • Sangsoo Kim,
  • Daewoong Nam,
  • Inhyuk Nam,
  • Gyujin Kim,
  • Chi Hyun Shim,
  • Haeryong Yang,
  • Myunghoon Cho,
  • Chang-Ki Min,
  • Changbum Kim,
  • Heung-Sik Kang,
  • Ivan A. Vartanyants

DOI
https://doi.org/10.1107/S1600577522008773
Journal volume & issue
Vol. 29, no. 6
pp. 1465 – 1479

Abstract

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A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70–80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility.

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