Assessment of MOV Deterioration under Energized Conditions

Abstract

Metal oxide varistors (MOVs) are widely used to protect electrical and electronic devices that are very vulnerable to surges due to the low insulation level of the equipment. MOVs deteriorate gradually due to manufacturing defects, mechanical and thermal stress, or repeated protective operations against surges. These defects result in the thermal runaway of MOV and finally lead to the explosion and electric fire of electrical and electronic devices due to a short circuit and a line-to-ground fault. Therefore, the reliable assessment of the condition of MOV deterioration is required for electrical and electronic equipment. However, when most accelerated degradation tests for the MOV have been performed to date, an 8/20 μs standard surge current is applied under de-energized conditions, which is unlike the actual operating environment. In this study, a surge generator was designed to apply a surge current to MOVs to monitor their deterioration. Three different types of leakage currents were measured to analyze the change rates of their electrical characteristics of MOVs by comparing them with the reference voltage variation. Furthermore, the condition assessment of MOV deterioration under energized and de-energized conditions was investigated.

Keywords

• metal oxide varistor
• deterioration
• condition assessment
• power semiconductor devices