APL Photonics (Mar 2019)

On the observation of dispersion in tunable second-order nonlinearities of silicon-rich nitride thin films

  • Hung-Hsi Lin,
  • Rajat Sharma,
  • Alex Friedman,
  • Benjamin M. Cromey,
  • Felipe Vallini,
  • Matthew W. Puckett,
  • Khanh Kieu,
  • Yeshaiahu Fainman

DOI
https://doi.org/10.1063/1.5053704
Journal volume & issue
Vol. 4, no. 3
pp. 036101 – 036101-6

Abstract

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We present experimental results on second-harmonic generation in non-stoichiometric, silicon-rich nitride films. The as-deposited film presents a second-order nonlinear coefficient, or χ(2), as high as 8 pm/V. This value can be widely tuned using the electric field induced second harmonic effect, and a maximum value of 22.7 pm/V was achieved with this technique. We further illustrate that the second-order nonlinear coefficient exhibited by these films can be highly dispersive in nature and require further study and analysis to evaluate their viability for in-waveguide applications at telecommunication wavelengths.