New FOM-Based Performance Evaluation of 600/650 V SiC and GaN Semiconductors for Next-Generation EV Drives

Abstract

The drive inverter represents a central component of an electric vehicle (EV) drive train, being responsible for the DC/AC power conversion between the battery and the electrical machine. In this context, novel converter topologies adopting modern 600/650V wide bandgap (WBG) semiconductor devices will play a crucial role in improving the performance of next-generation drive inverters. In fact, WBG devices theoretically allow to achieve both higher inverter power density and higher conversion efficiency with respect to conventional silicon (Si) IGBT based solutions. Even though silicon carbide (SiC) devices are already well established in the automotive industry, high-voltage gallium nitride (GaN) devices are rapidly entering the market, promising higher theoretical performance but featuring a lower degree of maturity. As a consequence, it is currently not clear which semiconductor technology is most suited for future EV drive inverters. Therefore, this paper aims to address this gap providing a comparative performance evaluation of state-of-the-art SiC and GaN 600/650V active switches. In particular, a novel figure-of-merit (FOM) representing the minimum theoretical semiconductor losses under hard-switching operation is introduced. Remarkably, this FOM enables a fair and accurate performance comparison among semiconductor devices, allowing to clearly determine the best performing technology for a given set of application-specific conditions. The results of the comparative assessment show that currently available SiC and GaN active switch technologies can outperform each other depending on the semiconductor operating temperature and the converter switching frequency.

Keywords

• Wide bandgap (WBG) devices
• silicon carbide (SiC)
• gallium nitride (GaN)
• high electron mobility transistors (HEMTs)
• figure-of-merit (FOM)
• hard-switching