The LFSR and BCA VHDL Models for Built-in Self-test Circuits

Abstract

The various test structures are proposed for BIST techniques [1],[2]. A typical structure used for generation of pseudo-random test setsis the linear feedback shift register (LFSR). The BIST techniques havewide application in testing whole devices and embedded components. Wefocus on the analysis of the state coverage, fault coverage, andoptimal structure of BIST schemes.