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Open Engineering
(Dec 2013)
Elastic fields of interacting point defects within an ultra-thin fcc film bonded to a rigid substrate
Shodja Hossein,
Tabatabaei Maryam,
Ostadhossein Alireza,
Pahlevani Ladan
Affiliations
Shodja Hossein
Tabatabaei Maryam
Department of Civil Engineering, Sharif University of Technology, P.O. Box 11155-9313, Tehran, Iran
Ostadhossein Alireza
Department of Engineering Science and Mechanics, W 305 Millinum Science Complex, The Pennsylvania State University, University Park, PA, 16802, USA
Pahlevani Ladan
Institute for Nanoscience and Nanotechnology, Sharif University of Technology, P.O. Box 11155-9161, Tehran, Iran
DOI
https://doi.org/10.2478/s13531-013-0116-7
Journal volume & issue
Vol. 3, no. 4
pp. 707 – 721
Abstract
Read online
No abstracts available.
Keywords
ultra-thin fcc film
interacting point defects
lattice statics method
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