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BIO Web of Conferences
(Jan 2024)
Mitigating radiation damage in beam sensitive battery materials by adapting scanning parameters
Jäkel Hannah Nickles,
Gautron Eric,
Peeman Maurice,
Moreau Philippe,
Abellan Patricia
Affiliations
Jäkel Hannah Nickles
Nantes Université, CNRS, Institut des Matériaux de Nantes Jean Rouxel, IMN
Gautron Eric
Nantes Université, CNRS, Institut des Matériaux de Nantes Jean Rouxel, IMN
Peeman Maurice
Thermo Fisher Scientific
Moreau Philippe
Nantes Université, CNRS, Institut des Matériaux de Nantes Jean Rouxel, IMN
Abellan Patricia
Nantes Université, CNRS, Institut des Matériaux de Nantes Jean Rouxel, IMN
DOI
https://doi.org/10.1051/bioconf/202412925009
Journal volume & issue
Vol. 129
p. 25009
Abstract
Read online
No abstracts available.
Keywords
beam-damage
scan pattern
battery materials
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