A Novel Method for Developing Thin Resin Scintillator Screens and Application in an X-ray CMOS Imaging Sensor

Abstract

Scintillating screens for X-ray imaging applications are prepared with various methods. Among them, the classic sedimentation method presents certain weak points. In this context, a novel fabrication process was developed that offers simplicity, economy of resources and time, while the screens exhibit adequate durability and image quality performance. The proposed technique involves a resin mixture that contains the phosphor in powder form (Gd2O2S:Tb in the present work) and graphite. The novel method was optimized and validated by coupling the screens to a complementary metal oxide semiconductor (CMOS) X-ray sensor. Indicatively, screens of two surface densities were examined; 34 mg/cm2 and 70 mg/cm2. Various established image quality metrics were calculated following the IEC 62220-1 international standard, including the detective quantum efficiency (DQE). Comparisons were carried out under the same conditions, with a sedimentation screen reported previously and a screen of wide commercial circulation (Carestream Min-R 2190). The novel screens exhibit has comparable or even better performance in image-quality metrics. The 34 mg/cm2 screen achieves a DQE 15–20% greater than its comparison counterpart, and its limiting resolution was 5.3 cycles/mm. The detector coupled to the 70 mg/cm2 screen achieved a DQE 10–24% greater than its own counterpart, and its limiting resolution was found to be 5.4 cycles/mm.

Keywords

• CMOS sensors
• X-ray
• Gd₂O₂S:Tb
• non-destructive testing
• DQE
• scintillators