Remote Sensing (Jun 2020)

Exploring TanDEM-X Interferometric Products for Crop-Type Mapping

  • Mario Busquier,
  • Juan M. Lopez-Sanchez,
  • Alejandro Mestre-Quereda,
  • Elena Navarro,
  • María P. González-Dugo,
  • Luciano Mateos

DOI
https://doi.org/10.3390/rs12111774
Journal volume & issue
Vol. 12, no. 11
p. 1774

Abstract

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The application of satellite single-pass interferometric data to crop-type mapping is demonstrated for the first time in this work. A set of nine TanDEM-X dual-pol pairs of images acquired during its science phase, from June to August 2015, is exploited for this purpose. An agricultural site located in Sevilla (Spain), composed of fields of 13 different crop species, is employed for validation. Sets of input features formed by polarimetric and interferometric observables are tested for crop classification, including single-pass coherence and repeat-pass coherence formed by consecutive images. The backscattering coefficient at HH and VV channels and the correlation between channels form the set of polarimetric features employed as a reference set upon which the added value of interferometric coherence is evaluated. The inclusion of single-pass coherence as feature improves by 2% the overall accuracy (OA) with respect to the reference case, reaching 92%. More importantly, in single-pol configurations OA increases by 10% for the HH channel and by 8% for the VV channel, reaching 87% and 88%, respectively. Repeat-pass coherence also improves the classification performance, but with final scores slightly worse than with single-pass coherence. However, it improves the individual performance of the backscattering coefficient by 6–7%. Furthermore, in products evaluated at field level the dual-pol repeat-pass coherence features provide the same score as single-pass coherence features (overall accuracy above 94%). Consequently, the contribution of interferometry, both single-pass and repeat-pass, to crop-type mapping is proved.

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