IEEE Photonics Journal (Jan 2012)

MeV Energy <formula formulatype="inline"><tex Notation="TeX">$\hbox{N}^{+}$</tex></formula>-Implanted Planar Optical Waveguides in Er-Doped Tungsten-Tellurite Glass Operating at 1.55 <formula formulatype="inline"><tex Notation="TeX"> $\mu\hbox{m}$</tex></formula>

  • I. Banyasz,
  • S. Berneschi,
  • M. Bettinelli,
  • M. Brenci,
  • M. Fried,
  • N. Q. Khanh,
  • T. Lohner,
  • G. Nunzi Conti,
  • S. Pelli,
  • P. Petrik,
  • G. C. Righini,
  • A. Speghini,
  • A. Watterich,
  • Z. Zolnai

DOI
https://doi.org/10.1109/JPHOT.2012.2194997
Journal volume & issue
Vol. 4, no. 3
pp. 721 – 727

Abstract

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We report on the fabrication and characterization of planar waveguides in an Er-doped tungsten-tellurite glass by implantation of 3.5 MeV N+ ions. Implantations were carried out in a wide fluence range of 1·1016 ÷8 ·1016 ions/cm2. Waveguides were characterized by m-line spectroscopy and spectroscopic ellipsometry. Irradiation-induced refractive index modulation saturated around a fluence of 8 ·1016 ions/cm2. Waveguides operating at 1550 nm were obtained in that material using 3.5 MeV N+ ion implantation.

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