The Directory of Open Access Journals
DOAJ Logotype
Open
Global
Trusted
Main actions
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Search
Menu
Secondary actions
Search
Journals
Articles
Documentation
API
OAI-PMH
Widgets
Public data dump
OpenURL
XML
Metadata help
Preservation
About
About DOAJ
DOAJ at 20
DOAJ team
Ambassadors
Advisory Board & Council
Editorial Policy Advisory Group
Volunteers
News
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Login
Login
Quick search
Close
×
Journals
Articles
Search by keywords:
In the field:
In all fields
Title
ISSN
Subject
Publisher
Country of publisher
Search
BIO Web of Conferences
(Jan 2024)
Breaking the limits of functional Atomic Force Microscopy imaging using Focused Electron Beam Induced Deposition
Brugger-Hatzl Michele,
Seewald Lukas,
Winkler Robert,
Kuhness David,
Huth Michael,
Barth Sven,
Plank Harald
Affiliations
Brugger-Hatzl Michele
Graz Centre for Electron Microscopy
Seewald Lukas
Christian Doppler Laboratory - DEFINE, Graz University of Technology
Winkler Robert
Christian Doppler Laboratory - DEFINE, Graz University of Technology
Kuhness David
Christian Doppler Laboratory - DEFINE, Graz University of Technology
Huth Michael
Institute of Physics, Goethe University
Barth Sven
Institute of Physics, Goethe University
Plank Harald
Graz Centre for Electron Microscopy
DOI
https://doi.org/10.1051/bioconf/202412910002
Journal volume & issue
Vol. 129
p. 10002
Abstract
Read online
No abstracts available.
Keywords
febid
afm
efm
cafm
mfm
WeChat QR code
Close