Optimal I–V Curve Scan Time for a GaAs Laser Power Converter

Abstract

Current–voltage (I–V) curve measurement is an essential performance characterization technique for laser power converters (LPCs). Choosing an appropriate scan time can effectively avoid problems in the test process that lead to inaccurate data. We analyzed the I–V curve error of a GaAs LPC in relation to scan time by building a test system for LPCs. A method for determining the optimal scan time, defined as a time period containing the upper limit and lower limit, is presented. The effects of the temperature of a measured GaAs LPC were investigated through comparative tests, and the upper limit of the scanning time was determined. The hysteresis of the equivalent capacitance in GaAs LPCs was analyzed. The upward limit of the scanning time was determined by establishing the relationship between the hysteresis of the I–V curve and the scanning time. It was concluded that the optimal scanning time of GaAs LPCs in the same structure ranges from 10 ms to 1 s.

Keywords

• optimal test time
• effect of capacitance
• temperature influence