AIP Advances (May 2017)

Tunneling magnetoresistance sensors with different coupled free layers

  • Yen-Fu Liu,
  • Xiaolu Yin,
  • Yi Yang,
  • Dan Ewing,
  • Paul J. De Rego,
  • Sy-Hwang Liou

DOI
https://doi.org/10.1063/1.4977774
Journal volume & issue
Vol. 7, no. 5
pp. 056666 – 056666-6

Abstract

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Large differences of magnetic coercivity (HC), exchange coupling field (HE), and tunneling magnetoresistance ratio (TMR) in magnetic tunnel junctions with different coupled free layers are discussed. We demonstrate that the magnetization behavior of the free layer is not only dominated by the interfacial barrier layer but also affected largely by the magnetic or non-magnetic coupled free layers. All these parameters are sensitively controlled by the magnetic nanostructure, which can be tuned also by the magnetic annealing process. The optimized sensors exhibit a large field sensitivity of up to 261%/mT in the region of the reversal synthetic ferrimagnet at the pinned layers.