APL Materials (Sep 2014)

The fate of the 2√3 × 2√3R(30°) silicene phase on Ag(111)

  • Zhi-Long Liu,
  • Mei-Xiao Wang,
  • Canhua Liu,
  • Jin-Feng Jia,
  • Patrick Vogt,
  • Claudio Quaresima,
  • Carlo Ottaviani,
  • Bruno Olivieri,
  • Paola De Padova,
  • Guy Le Lay

DOI
https://doi.org/10.1063/1.4894871
Journal volume & issue
Vol. 2, no. 9
pp. 092513 – 092513-5

Abstract

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Silicon atoms deposited on Ag(111) produce various single layer silicene sheets with different buckling patterns and periodicities. Low temperature scanning tunneling microscopy reveals that one of the silicene sheets, the hypothetical √7 × √7 silicene structure, on 2√3 × 2√3 Ag(111), is inherently highly defective and displays no long-range order. Moreover, Auger and photoelectron spectroscopy measurements reveal its sudden death, to end, in a dynamic fating process at ∼300 °C. This result clarifies the real nature of the 2√3 × 2√3R(30°) silicene phase and thus helps to understand the diversity of the silicene sheets grown on Ag(111).