BIO Web of Conferences (Jan 2024)

Automated Detection of Material Defects for High-throughput Electron Micrographs Analysis

  • Durnescu Andrei Tudor,
  • Morón Sotero Pedro Romero,
  • König Christina Nicole,
  • Jinschek Joerg R.

DOI
https://doi.org/10.1051/bioconf/202412923034
Journal volume & issue
Vol. 129
p. 23034

Abstract

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Keywords