Active and Passive Electronic Components (Jan 1987)

Low Frequency Noise in Tantalum Capacitors

  • D. T. Smith

DOI
https://doi.org/10.1155/1987/10769
Journal volume & issue
Vol. 12, no. 4
pp. 215 – 221

Abstract

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Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 Hz. The noise current was found to have a 1/f power spectrum, and the amplitude varied with the bias voltage with a law in the range 1st to 4th power. There was a large difference in amplitudes between different capacitors of the same type.