Data in Brief (Aug 2017)

Data on TOF-SIMS analysis of Cu2+, Co2+ and Cr3+ doped calcium phosphate cements

  • Anja Henß,
  • Martha Schamel,
  • Uwe Gbureck,
  • Michael Gelinsky,
  • Anja Lode

Journal volume & issue
Vol. 13
pp. 353 – 355

Abstract

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This article contains data of time of flight secondary ion mass spectrometry (TOF-SIMS) analysis of brushite-forming calcium phosphate cements doped with biologically active metal ions. This data are related to the research article “Cu2+, Co2+ and Cr3+ doping of a calcium phosphate cement influences materials properties and response of human mesenchymal stromal cells” (Schamel et al., 2017) [1]. Cu2+, Co2+ and Cr3+ doped β-tricalcium phosphate precursor powders were used to prepare cement samples. The incorporation and distribution of the metal ions in the cement matrix was visualized by imaging mass spectrometry.