IEEE Journal of the Electron Devices Society (Jan 2015)

Source-Pull and Load-Pull Characterization of Graphene FET

  • Sebastien Fregonese,
  • Magali de Matos,
  • David Mele,
  • Cristell Maneux,
  • Henri Happy,
  • Thomas Zimmer

DOI
https://doi.org/10.1109/JEDS.2014.2360408
Journal volume & issue
Vol. 3, no. 1
pp. 49 – 53

Abstract

Read online

This paper presents the characterization of a GFET transistor using a source-pull/load-pull test set. The characterization shows that despite the good fT and fMAX, it is hard to achieve power gain using the GFET device within a circuit configuration. This is due to the very high impedance at the gate making impedance matching at the input extremely difficult. S-parameter characterization is performed and the associated small signal model is developed in order to further analyse and extrapolate the source-pull and load-pull measurement results. A good agreement is observed between small signal model simulation results and source-pull/load-pull measurements. Finally, the model is used to evaluate the optimum power gain of the transistor in a circuit configuration under matched conditions.

Keywords