IEEE Journal of the Electron Devices Society (Jan 2018)

Demonstration of Symmetric Lateral NPN Transistors on SOI Featuring Epitaxially Grown Emitter/Collector Regions

  • Pouya Hashemi,
  • Jeng-Bang Yau,
  • Kevin K. Chan,
  • Tak H. Ning,
  • Ghavam G. Shahidi

DOI
https://doi.org/10.1109/JEDS.2017.2776902
Journal volume & issue
Vol. 6
pp. 537 – 542

Abstract

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Symmetric lateral NPN bipolar junction transistors on Si-on-insulator having epitaxially grown emitter/collector regions are demonstrated, for the first time. A novel notch-assisted epitaxy scheme has been developed using faceted Si epitaxial (epi) layers as reactive-ion-etch mask to expose the vertical intrinsic-base epi-seeding surfaces and the epi emitter and collector are automatically connected to the extension regions for metal contact and/or for electrical probing. Functional transistors with good quality device I-V characteristics were obtained with post-epi rapid thermal annealing. The results suggest a path forward for devices suitable for low-cost THz electronics applications. Some learning about the fabrication, as revealed from measured device characteristics, are discussed.

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