IEEE Journal of the Electron Devices Society (Jan 2017)

Performance Projections for a Reconfigurable Tunnel NanoFET

  • Stefan Blawid,
  • Denise L. M. de Andrade,
  • Sven Mothes,
  • Martin Claus

DOI
https://doi.org/10.1109/JEDS.2017.2756040
Journal volume & issue
Vol. 5, no. 6
pp. 473 – 479

Abstract

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Theoretical performance projections of a reconfigurable tunnel (RT) field-effect transistor (FET) employing multiple parallel 1-D channels are given. The RT-nanoFET can be reconfigured on demand from pto n-type and from low power (LP) to high performance (HP) operation. In LP mode, a subthreshold swing S below 60 mV/dec is predicted for a current density per gate width up to 3 nA/μm. By changing the polarities of the program gates to HP mode the current density can be increased to more than 110 μA/μm. Thus, LP/HP reconfigurability liberates the transistor from the necessity to deliver low S up to very high current densities.

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