Analysis of Kink Effect in Short-Channel Floating Body PD-SOI MOSFETs

Abstract

The origin of a greater decrease in kink drain voltage $V_{kink}$ in floating body PD-SOI MOSFETs with gate lengths shorter than $0.35 ~\mu m$ is newly revealed. The $V_{kink}$ formula as a function of the internal body voltage and $I_{DS}$ is derived by combining the modified impact ionization multiplication factor with the body-source junction I-V equation. The parameters in this formula are extracted from the measured data of $I_{B}$ vs. $V_{BS}$ and ${- I}_{B}/I_{DS}$ vs. $V_{DS}$ in the body contacted devices. By calculating the formula using the extracted parameters, it is newly found that a decrease of the drain-source saturation voltage at a shorter channel is a primary cause for the short-channel effect on $V_{kink}$ reduction.

Keywords

• Kink effect
• SOI MOSFET
• short-channel
• floating body
• gate length dependence
• parasitic BJT