Carrier-envelope-phase tagging in measurements with long acquisition times

Abstract

We present a detailed analysis of the systematic errors that affect single-shot carrier envelope phase (CEP) measurements in experiments with long acquisition times, for which only limited long-term laser stability can be achieved. After introducing a scheme for eliminating these systematic errors to a large extent, we apply our approach to investigate the CEP dependence of the yield of doubly charged ions produced via non-sequential double ionization of argon in strong near-single-cycle laser pulses. The experimental results are compared to predictions of semiclassical calculations.