Metrology (Dec 2022)

Uncertainty-Based Autonomous Path Planning for Laser Line Scanners

  • Michiel Vlaeyen,
  • Han Haitjema,
  • Wim Dewulf

DOI
https://doi.org/10.3390/metrology2040028
Journal volume & issue
Vol. 2, no. 4
pp. 479 – 494

Abstract

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This study proposes an algorithm to autonomously generate the scan path for a laser line scanner mounted on a coordinate measuring machine. The scan path is determined based on task-specific measurement uncertainty in order to prove conformance to specified tolerances. The novelty of the algorithm is the integration of measurement uncertainty. This development is made possible by recent developments for digital twins of optical measurement systems. Furthermore, the algorithm takes all the constraints of this optical measurement system into account. The proposed algorithm is validated on different objects with different surface characteristics. The validation is performed experimentally by a physical measurement system and virtually by an in-house developed digital twin. The validation proves that theoretical coverable areas are measured properly, and the method applied to the equipment used leads to adequate measurement paths that give measurements results with sufficient measurement uncertainty to prove conformance to specifications.

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