Metrology

2673-8244 (Online)

About

Publishing with this journal

Expect on average 6 weeks from submission to publication.

Best practice

The author retains unrestricted copyrights and publishing rights.

→ Learn more about their copyright policy.

Articles digitally archived in:

  • CLOCKSS
  • A national library: Swiss National Library

→ Find out about their archiving policy.

Permanent article identifier:

  • DOI

Journal metadata

Publisher
MDPI AG, Switzerland
Manuscripts accepted in
English
LCC subjects Look up the Library of Congress Classification Outline
Science: Mathematics: Instruments and machines: Electronic computers. Computer science
Technology: Technology (General): Industrial engineering. Management engineering: Applied mathematics. Quantitative methods
Keywords
traceability to si units of complex measurement systems considerations on the fundamentals of measurement cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes