Успехи физики металлов (Dec 2007)

Structural-Phase State, Stability of Interfaces and Electrophysical Properties of Two-Layer Film Systems

  • S. I. Protsenko, I. V. Cheshko, D. V. Velykodnyj, I. V. Pazukha, L. V. Odnodvorets’, I. Yu. Protsenko, O. V. Synashenko

DOI
https://doi.org/10.15407/ufm.08.04.247
Journal volume & issue
Vol. 8, no. 4
pp. 247 – 278

Abstract

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The generalized literary data and results of own experimental investigations of structural and phase state, stability of interfaces and electrophysical properties (thermal coefficient of resistance (TCR) and strain-gauge factor (SGF)) for two-layer film systems, Cu/(Co, Ag or Au), Cu/(Cr or Fe) and Fe/Cr, are presented. The choice of these systems is caused by stabilization of various structural and phase states in them such as granular solid solutions (systems based on Cu and Co, Ag or Au), solid solutions (Fe/Cr), two-layer systems with conservation of individuality of separate layers (biplate) (Cu/Cr and Cu/Fe systems (below 700 K)). Experimental results for TCR and SGF agree well or satisfactory with relationships for TCR and SGF of the biplate, film alloy or two-layer system with an intermediate layer of solid solution near the interface. It can serve as an additional argument in favour of conclusions concerning structural and phase state of two-layer system.

Keywords