An iterative method for robust in-line phase contrast imaging

Abstract

We present an iterative near-field in-line phase contrast method that allows quantitative determination of the thickness of an object given the refractive index of the sample material. The iterative method allows for quantitative phase contrast imaging in regimes where the contrast transfer function (CTF) and transport of intensity equation (TIE) cannot be applied. Further, the nature of the iterative scheme offers more flexibility and potentially allows more high-resolution image reconstructions when compared to TIE method and less artefacts when compared to the CTF method. While, not addressed here, extension of our approach in future work to broadband illumination will also be straightforward as the wavelength dependence of the refractive index of an object can be readily incorporated into the iterative approach.

Keywords

• x-ray microscope
• iterative algorithm
• near field
• phase contrast imaging