IEEE Journal of the Electron Devices Society (Jan 2021)

Extremely-Low Threshold Voltage FinFET for 5G mmWave Applications

  • A. Razavieh,
  • Y. Chen,
  • T. Ethirajan,
  • M. Gu,
  • S. Cimino,
  • T. Shimizu,
  • M. K. Hassan,
  • T. Morshed,
  • J. Singh,
  • W. Zheng,
  • V. Mahajan,
  • H. T. Wang,
  • T. H. Lee

DOI
https://doi.org/10.1109/JEDS.2020.3046953
Journal volume & issue
Vol. 9
pp. 165 – 169

Abstract

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An optimized doping process is used to achieve extremely-low threshold voltage (ELVT) FinFETs for low-power mmWave applications based on 12nm node technology platform. With the $V_{TH}\approx 100$ mV ELVT FinFET shows 15% $I_{EFF}$ improvement at the same $V_{DD}$ compared to its super-low threshold voltage (SLVT) counterpart, while mismatch and reliability performances are comparable. $F_{T}/F_{MAX}$ of ~305GHz/~315GHz and comparable Maximum Stable Gain (MSG) to SLVT FinFET gives ELVT FinFET an advantage for mmWave 5G low-power applications. Local oscillator (LO) chain blocks are investigated as a circuit level example to confirm the benefits of ELVT FinFET. An optimized LO transmission Line (TL) driver using ELVT FinFETs results in ~9% and ~8% reduction in $V_{DD}$ and power consumption respectively at the same phase-noise (PN) level as the SLVT based design. If operated at the same $V_{DD}$ of 0.525V ELVT FinFET can improve the VCO Figure of Merit ( $FOM_{VCO}$ ) by ~2.8dB.

Keywords