Metrology (Apr 2023)

Measurement Techniques for Three-Dimensional Metrology of High Aspect Ratio Internal Features—A Review

  • Tom Hovell,
  • Jon Petzing,
  • Wen Guo,
  • Connor Gill,
  • Laura Justham,
  • Niels Lohse,
  • Peter Kinnell

DOI
https://doi.org/10.3390/metrology3020009
Journal volume & issue
Vol. 3, no. 2
pp. 139 – 168

Abstract

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Non-destructive measurements of high aspect ratio microscale features, especially those with internal geometries such as micro-holes, remain a challenging metrology problem that is increasing in difficulty due to the increasing requirement for more complexity and higher tolerances in such structures. Additionally, there is a growing use of functional surface texturing for improving characteristics such as heat transfer and wettability. As a result, measurement techniques capable of providing dimensional form and surface finish for these features are of intense interest. This review explores the state-of-the-art inspection methodologies compatible with high-aspect-ratio structures and their suitability for extracting three-dimensional surface data based on identified high-aspect ratio structure types. Here, the abilities, limitations, challenges, and future requirements for the practical implementation and acceptance of these measurement techniques are presented.

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