Saturating multiple ionization in intense mid-infrared laser fields

Abstract

The interpretation of experimental data from novel mid-infrared few-cycle laser sources requires an understanding of ionization mechanisms and knowledge about related ion yields. Experimental studies have indicated sequential double ionization as the dominant process above 10 ^14 W cm ^−2 . These results contradict a recent prediction that in this spectral region, non-sequential processes dominate the double ionization of xenon up to intensities of about 10 ^15 W cm ^−2 . In either case, the ratio of doubly to singly charged xenon yield reported in previous studies has been limited to a few percent, indicating a regime well below the onset of saturation of the double ionization process. We present an experimental study of double ionization of xenon and krypton atoms exposed to intense near four-cycle pulses at 3.2 μ m. Our experiments rely on the ion microscopy technique, which facilitates the detection of ions originating from a restricted region within the interaction volume, thereby reducing the impact of focal averaging. Our measurements suggest that at intensities of close to 1.2 × 10 ^14 W cm ^−2 , double ionization of xenon and krypton is already significantly saturated. In particular, we find a doubly to singly charged yield ratio of about 75 percent for xenon and 25 percent for krypton. We compare our results with the predictions of different models accounting for the effects of volume averaging and focal geometry. We find that in the deeply saturated regime of our experiment, the Perelomov–Popov–Terentyev theory significantly underestimates the observed double ionization yield.

Keywords

• strong-field ionization
• multi-photon ionization in mid-IR laser pulses
• ion microscopy