Basic Physics of Multiparameter Crystallography: Diagnostics of Defects of Several Types in Single-Crystal Materials and Articles of Nanotechnologies

Abstract

The paper deals with both the disclosure of the physical nature and the development of the practical application principles of recently discovered authoring phenomenon of unique structural sensitivity and informativity dependences on diffraction conditions of pattern of multiple Bragg and diffuse x-ray scattering as well as scattering of neutrons, electrons and another charged particles in a monocrystal with defects. This phenomenon is absent in principle with single scattering, i.e. within the kinematical diffraction case. As shown, this discovered dependence of character of defect influence on the dynamical diffraction pattern on diffraction conditions is evinced as multiformity of pattern uniquely sensitive to defects under experimental observation of it within the different diffraction conditions. As ascertained, this phenomenon is determined by formation (by crystal with defects) of the selforganizing standing Bragg and diffuse wave fields during the multiple scattering process, which are governed by diffraction conditions and depend on defect characteristics. Formation of such sonde with atom-dimensional periodicity and according unique resolving power provides strong dependence of character of follow-up multiple interaction between the crystal and this wave field on their relative localization; both interaction and localization are governed by diffraction conditions and defect characteristics. As a result, dynamical scattering pattern is appeared, depending on diffraction conditions and defect characteristics in interplay manner (in contrast to kinematical case). In a given paper, different mechanisms of competitive influence of various-type multiplicity effects on the result of both interaction of the mentioned sonde with a crystal and formation of multiformity sensitive to deviations from the periodicity due to providing interrelationship of dynamical diffraction pattern dependences on diffraction conditions and defect characteristics (as a reason determining phenomenon at issue) are considered. This phenomenon is used for creation of basis for diffuse-dynamical combined diffractometry of multiparameter monocrystal materials and multilayer systems with defects of several types. The results of both creation of theoretical models, which are necessary for multiparameter systems with complicated structure, and development of practical realization principles and analysis of multiparameter diagnostic opportunities, i.e. unambiguous solution of inverse problem of the reconstruction of both characteristics of defects of several types and various superstructure parameters for monocrystal materials and nanotechnology articles by multiple scattering pattern in the various dynamical diffraction conditions, are stated.

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