New Journal of Physics (Jan 2020)

Dissolution of donor-vacancy clusters in heavily doped n-type germanium

  • Slawomir Prucnal,
  • Maciej O Liedke,
  • Xiaoshuang Wang,
  • Maik Butterling,
  • Matthias Posselt,
  • Joachim Knoch,
  • Horst Windgassen,
  • Eric Hirschmann,
  • Yonder Berencén,
  • Lars Rebohle,
  • Mao Wang,
  • Enrico Napolitani,
  • Jacopo Frigerio,
  • Andrea Ballabio,
  • Giovani Isella,
  • René Hübner,
  • Andreas Wagner,
  • Hartmut Bracht,
  • Manfred Helm,
  • Shengqiang Zhou

DOI
https://doi.org/10.1088/1367-2630/abc466
Journal volume & issue
Vol. 22, no. 12
p. 123036

Abstract

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The n-type doping of Ge is a self-limiting process due to the formation of vacancy-donor complexes (D _n V with n ⩽ 4) that deactivate the donors. This work unambiguously demonstrates that the dissolution of the dominating P _4 V clusters in heavily phosphorus-doped Ge epilayers can be achieved by millisecond-flash lamp annealing at about 1050 K. The P _4 V cluster dissolution increases the carrier concentration by more than three-fold together with a suppression of phosphorus diffusion. Electrochemical capacitance–voltage measurements in conjunction with secondary ion mass spectrometry, positron annihilation lifetime spectroscopy and theoretical calculations enabled us to address and understand a fundamental problem that has hindered so far the full integration of Ge with complementary-metal-oxide-semiconductor technology.

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