IEEE Journal of the Electron Devices Society (Jan 2013)

Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors

  • Eric R. Fossum

DOI
https://doi.org/10.1109/JEDS.2013.2284054
Journal volume & issue
Vol. 1, no. 9
pp. 166 – 174

Abstract

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Imaging performance metrics of single-bit and multi-bit photo-electron-counting quanta image sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. The D-log H characteristic of single-bit sensors including overexposure latitude is quantified. Linearity and dynamic range are also investigated. Read-noise-induced bit-error rate is analyzed and a read-noise target of less than 0.15 e-rms is suggested.

Keywords