IEEE Journal of the Electron Devices Society (Jan 2018)

Bipolar Resistive Switching Characteristics in Flexible Pt/MZT/Al Memory and Ni/NbO<sub>2</sub>/Ni Selector Structure

  • Ke-Jing Lee,
  • Yu-Chi Chang,
  • Cheng-Jung Lee,
  • Li-Wen Wang,
  • Yeong-Her Wang

DOI
https://doi.org/10.1109/JEDS.2018.2801278
Journal volume & issue
Vol. 6
pp. 518 – 524

Abstract

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The use of a threshold-switching Ni/NbO2/Ni device with a memory-switching Pt/magnesium zirconate titanate/Al device on a flexible substrate was proposed to suppress undesired sneak currents. The proposed flexible one selector and one resistor (1S1R) memory device exhibits a low operation voltage, good ON/OFF ratio of 105, uniform current distribution, excellent flexibility, and stable I-V curve at 85 °C. The good selection and memory properties of the flexible 1S1R memory device are highly promising for high-density and low-power flexible electronic applications.

Keywords