Scanning high-sensitive x-ray polarization microscopy

Abstract

We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 ^−11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning x-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics.

Keywords

• x-ray polarimetry
• x-ray lenses
• x-ray polarization microscopy
• x-ray optics
• channel-cut crystals