Informacije MIDEM (Aug 2022)

Analysis of effects of dangling-bond defects in doped a-Si:H layers in heterojunction silicon solar cells with different electron affinities of ITO contacts

  • J. Balent,
  • F. Smole,
  • M. Topič,
  • J. Krč

DOI
https://doi.org/10.33180/InfMIDEM2022.206
Journal volume & issue
Vol. 52, no. 2
pp. 129 – 142

Abstract

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